Measure, analyse and innovate: an on-going challenge!
The CIM 2017, International Metrology Congress, will be held, from 19 to 21 September in Paris (France).
The CIM is a unique crossroads between R&D and industrial applications for all actors and all fields: industrial end- users of measurement equipments, technical experts, public and private laboratories, manufacturers and service providers.
The Congress allows to:
- improve your measurement, analysis and test processes, whilst reducing any inherent risks
- explore evolutions in techniques, R&D progress and learn more about practical industrial applications
The major topics are: metrology 4.0 and factory of the future, new ISO 17 025, metrology for biology, health and pharmaceutics, new developments in energy, nanotechnologies ...
The CIM 2017 is co-organised with ENOVA Paris, the reference exhibition for technologies in Electronic, IoT, Measurement, Vision and Optic.
More information: www.cim2017.com